Fabricating and Aligning Silicon Nanowires to Investigate Size Dependence for Quantum Confinement and Electronic Transport Analysis Section

ثبت نشده
چکیده

The fabrication and understanding of the fundamental properties of well-defined one-dimensional structures are critical towards the development of nanostructures, nanomaterials, and developing nanotechnology. One-dimensional nanostructures can address basic issues about size and dimensionality in applications such as photonics [1,2], nanoelectronics [3,4], nanostructured materials [5,6], and material composites [7,8]. In addition, these structures can efficiently transport electrons and excitons, making them ideal for molecular-scale electronic architectures. Silicon devices have become essential in many current technology devices. As the miniaturization of transistors and circuits continue to progress, the need to wire and connect electronic components become crucial in order for microelectronics to scale down to nanoelectronics. Although nanoscale silicon devices [9,10] as well as wires to connect [11-13] and array [14-16] them have been in development, many obstacles still await. Devices need to be connected to one another; wires, looped and tangled, need to be straightened for circuitry, arrayed wires lack uniform spacing and sometimes the ability to be connected to macro-scale devices. We attempt to address some of the fundamental problems in nanoscale electronics. Specifically, we propose a strategy to fabricate and align silicon nanowires – to directly specify nanoscale wire diameter (as low as 5 nm), align them, and measure the associated electronic characteristics. The strategy has two unique characteristics. First, the nanowires are perfectly aligned during fabrication. Second, the strategy will enable a simple, rapid, and direct manner to explore nanoscale electronic properties of the nanowires. The method will combine “top down” approaches, such as electron beam (ebeam) lithography and plasma-assisted dry etching, with a “bottom-up” approach, such as molecular beam epitaxy (MBE), to fabricate, align, and array nanowires. E-beam lithography and plasma etching will pattern and etch nanometer-sized channels, as small as 5 nm wide, in a thin film, providing a fast and simple technique to create nanometer-sized dimensions on a substrate. MBE will then grow single crystal nanowires in each channel. Since MBE uses a variety of materials for epitaxial growth, metallic and semiconducting nanowires can be deposited onto the substrate. All nanowires will be extensively characterized and analyzed for purity using techniques such as high-resolution transmission electron microscopy (HR-TEM), X-Ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), and energy dispersive X-Ray spectroscopy (EDX). Then, etching and evaporating electrodes at the ends of each nanowire will individually address each nanowire wire. Electrical properties on the nanoscale (10 nm) regime can then be investigated. By combining these two design paradigms, this proposed strategy will provide controlled wire growth on the atomic scale. The fabricated nanowires will be used to investigate the role of dimensionality and size for electron transport and quantum confinement in nanostructures to further understanding of nanoscale phenomena.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Numerical study of the thermoelectric power factor in ultra-thin Si nanowires

Low dimensional structures have demonstrated improved thermoelectric (TE) performance because of a drastic reduction in their thermal conductivity, κl . This has been observed for a variety of materials, even for traditionally poor thermoelectrics such as silicon. Other than the reduction in κl , further improvements in the TE figure of merit ZT could potentially originate from the thermoelectr...

متن کامل

Quantum confinement and electronic properties of tapered silicon nanowires.

Using ab initio calculations, structural tapering of silicon nanowires is shown to have a profound effect on their electronic properties. In particular, the electronic structure of small-diameter tapered silicon nanowires is found to have a strong axial dependence, with unoccupied eigenstates being substantially more sensitive to diameter. Moreover, the states corresponding to the highest occup...

متن کامل

Quantum current modeling in nano-transistors with a quantum dot

Carbon quantum dots (CQDs) serve as a new class of ‘zero dimensional’ nanomaterial’s in thecarbon class with sizes below 10 nm. As light emitting nanocrystals, QDs are assembled from semiconductormaterials, from the elements in the periodic groups of II-VI, III-V or IV-VI, mainly thanks to impacts of quantum confinement QDs have unique optical properties such as brighter, highly pho...

متن کامل

Carrier Transport in Ultra-Thin Nano/Polycrystalline Silicon Films and Nanowires

Carrier transport was investigated in two different types of ultra-thin silicon films, polycrystalline silicon (poly-Si) films with large grains > 20 nm in size and hydrogenated nanocrystalline silicon (nc-Si:H) films with grains 4 nm – 8 nm in size. It was found that there were local non-uniformities in grain boundary potential barriers in both types of films. Single-electron charging effects ...

متن کامل

Impact of Silicon Wafer Orientation on the Performance of Metal Source/Drain MOSFET in Nanoscale Regime: a Numerical Study

A comprehensive study of Schottky barrier MOSFET (SBMOSFET) scaling issue is performed to determine the role of wafer orientation and structural parameters on the performance of this device within Non-equilibrium Green's Function formalism. Quantum confinement increases the effective Schottky barrier height (SBH). (100) orientation provides lower effective Schottky barrier height in compa...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2003